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cond-mat.mes-hall2006★ 11 cited
Shot noise of a multiwalled carbon nanotube field effect transistor
F. Wu, T. Tsuneta, R. Tarkiainen +3
We have investigated shot noise in a 6-nm-diameter, semiconducting multiwalled carbon nanotube FET at 4.2 K over the frequency range 600 - 950 MHz. We find a transconductance of 3…
cond-mat.mes-hall2002
Noise in the Single Electron Transistor and its back action during measurement
G. Johansson, P. Delsing, K. Bladh +5
Single electron transistors (SETs) are very sensitive electrometers and they can be used in a range of applications. In this paper we give an introduction to the SET and present a…