140 citations · 682 across the 31 of their papers we have counts for
4 papers · 2 filters
Challenges for Silicon Pixel Sensors at the European XFEL
Robert Klanner, Julian Becker, Eckhart Fretwurst +4
A systematic experimental study of the main challenges for silicon-pixel sensors at the European XFEL is presented. The high instantaneous density of X-rays and the high repetition…
Design of the AGIPD Sensor for the European XFEL
J. Schwandt, E. Fretwurst, R. Klanner +1
For experiments at the European X-Ray Free-Electron Laser (XFEL) the Adaptive Gain Integrating Pixel Detector (AGIPD) is under development. The particular requirements for the dete…
Investigation of X-ray induced radiation damage at the Si-SiO2 interface of silicon sensors for the European XFEL
Jiaguo Zhang, Eckhart Fretwurst, Robert Klanner +3
Experiments at the European X-ray Free Electron Laser (XFEL) require silicon pixel sensors which can withstand X-ray doses up to 1 GGy. For the investigation of X-ray radiation dam…
Charge losses in segmented silicon sensors at the Si-SiO2 interface
Thomas Poehlsen, Eckhart Fretwurst, Robert Klanner +3
Using multi-channel time-resolved current measurements (multi TCT), the charge collection of p+n silicon strip sensors for electron-hole pairs produced close to the Si-SiO2 interfa…