3 citations · 4 across the 3 of their papers we have counts for
Showing cs.CVShow all
2 papers · 1 filter
cs.CV2021★ 1 cited
Automatic Head Overcoat Thickness Measure with NASNet-Large-Decoder Net
Youshan Zhang, Brian D. Davison, Vivien W. Talghader +3
Transmission electron microscopy (TEM) is one of the primary tools to show microstructural characterization of materials as well as film thickness. However, manual determination of…
cs.CV2021★ 3 cited
Local Aggressive Adversarial Attacks on 3D Point Cloud
Yiming Sun, Feng Chen, Zhiyu Chen +1
Deep neural networks are found to be prone to adversarial examples which could deliberately fool the model to make mistakes. Recently, a few of works expand this task from 2D image…