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Tip-gating Effect in Scanning Impedance Microscopy of Nanoelectronic Devices
Sergei V. Kalinin, Dawn A. Bonnell, Marcus Freitag +1
Electronic transport in semiconducting single-wall carbon nanotubes is studied by combined scanning gate microscopy and scanning impedance microscopy (SIM). Depending on the probe…
Nanoscale Electric Phenomena at Oxide Surfaces and Interfaces by Scanning Probe Microscopy
Sergei V. Kalinin
Scanning Probe Microscopy is used to study and quantify the nanoscale electric phenomena in the two classes of oxide systems, namely transport at electroactive grain boundaries and…
Role of Single Defects in Electronic Transport through Carbon Nanotube Field-Effect Transistors
Marcus Freitag, Sergei V. Kalinin, Dawn A. Bonnell +1
The influence of defects on electron transport in single-wall carbon nanotube field effect transistors (CNFETs) is probed by combined scanning gate microscopy (SGM) and scanning im…
Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies
Sergei V. Kalinin, Marcus Freitag, A. T. Johnson +1
Scanning Surface Potential Microscopy (SSPM) is one of the most widely used techniques for the characterization of electrical properties at small dimensions. Applicability of SSPM…