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20032026
most citedFactors that control stability, variability, and reliability issues of endurance cycle in ReRAM devices: a phase field study

9 citations · 15 across the 6 of their papers we have counts for

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cond-mat.mtrl-sci2026

Unified Phase-Field Framework for Antiferroelectric, Ferroelectric and Dielectric Phases: Application to HZO Thin Films

P. Pankaj, Sandeep Sugathan, Si Joon Kim +1

Polycrystalline hafnia-based thin films exhibit mixed ferroelectric (FE), antiferroelectric (AFE), and dielectric (DE) behavior, with switching characteristics strongly influenced…