activity
20182021
most citedCryogenic Modeling of MOSFET Device Based on BSIM and EKV Models

2 citations · 3 across the 3 of their papers we have counts for

collaborators

8 papers

physics.app-ph20212 cited

Cryogenic Modeling of MOSFET Device Based on BSIM and EKV Models

Tengteng Lu, Yuanke Zhang, Yujing Zhang +3

Kink effect is a large obstacle for the cryogenic model of inversion-type bulk silicon MOSFET devices. This letter used two methods to correct the kink effect: the modified evoluti…

physics.app-ph20191 cited

Cryogenic low power CMOS analog buffer at 4.2K

Yajie Huang, Chao Luo, Tengteng Lu +3

A novel power-efficient analog buffer at liquid helium temperature is proposed. The proposed circuit is based on an input stage consisting of two complementary differential pairs t…

physics.app-ph2019

Characterization of 0.18μm CMOS Ring Oscillator at Liquid Helium Temperature

Chao Luo, Tengteng Lu, Zhen Li +2

This paper presents low power dissipation, low phase noise ring oscillators (ROs) based on Semiconductor Manufacturing International Corporation (SMIC) 0.18μm CMOS technology at li…

cond-mat.mes-hall2019

Design of graphene waveguide: Effect of edge orientation and waveguide configuration

Nayyar Abbas Shah, Vahid Mosallanejad, Kuei-Lin Chiu +1

Electron transport in a graphene quantum well can be analogous to photon transmission in an optical fiber. In this work, we present a detailed theoretical analysis to study the tra…

physics.app-ph2018

Characterization and Modeling of 0.18μm CMOS Technology at sub-Kelvin Temperature

Tengteng Lu, Zhen Li, Chao Luo +3

Previous cryogenic electronics studies are most above 4.2K. In this paper we present the cryogenic characterization of a 0.18μm standard bulk CMOS technology(1.8V and 5V) at sub-ke…

physics.app-ph2018

MOSFET Characterization and Modeling at Cryogenic Temperatures

Chao Luo, Zhen Li, TengTeng Lu +2

Cryogenic CMOS technology (cryo-CMOS) offers a scalable solution for quantum device interface fabrication. Several previous works have studied the characterization of CMOS technolo…