activity
20192023
most citedStrain, doping and electronic transport of large area monolayer MoS2 exfoliated on gold and transferred to an insulating substrate

128 citations · 393 across the 13 of their papers we have counts for

collaborators
Showing 2020Show all

7 papers · 1 filter

cond-mat.mtrl-sci2020★ 11 cited

Nanoscale structural and electrical properties of graphene grown on AlGaN by catalyst-free chemical vapor deposition

F. Giannazzo, R. Dagher, E. Schilirò +8

The integration of graphene (Gr) with nitride semiconductors is highly interesting for applications in high-power/high-frequency electronics and optoelectronics. In this work, we d…

physics.app-ph2020★ 11 cited

Thermal Annealing Effect on Electrical and Structural Properties of Tungsten Carbide Schottky Contacts on AlGaN/GaN heterostructures

Giuseppe Greco, Salvatore Di Franco, Corrado Bongiorno +4

Tungsten carbide (WC) contacts have been investigated as a novel gold-free Schottky metallization for AlGaN/GaN heterostructures. The evolution of the electrical and structural/com…

physics.app-ph2020★ 17 cited

Electrical properties of inhomogeneous tungsten carbide Schottky barrier on 4H-SiC

Marilena Vivona, Giuseppe Greco, Gabriele Bellocchi +5

In this paper, the electrical behavior of tungsten carbide (WC) Schottky barrier on 4H-SiC was investigated. First, a statistical current-voltage (I-V) analysis in forward bias, pe…

physics.app-ph2020★ 11 cited

Processing issues in SiC and GaN power devices technology: the cases of 4H-SiC planar MOSFET and recessed hybrid GaN MISHEMT

Fabrizio Roccaforte, Giuseppe Greco, Patrick Fiorenza

This paper aims to give a short overview on some relevant processing issues existing in SiC and GaN power devices technology. The main focus is put on the importance of the channel…

physics.app-ph2020★ 26 cited

Impact of stacking faults and domain boundaries on the electronic transport in cubic silicon carbide probed by conductive atomic force microscopy

F. Giannazzo, G. Greco, S. Di Franco +8

In spite of its great promises for energy efficient power conversion, the electronic quality of cubic silicon carbide (3C-SiC) on silicon is currently limited by the presence of a…

physics.app-ph2020★ 35 cited

Effect of high temperature annealing (T > 1650°C) on the morphological and electrical properties of p-type implanted 4H-SiC layers

Monia Spera, Domenico Corso, Salvatore Di Franco +5

This work reports on the effect of high temperature annealing on the electrical properties of p-type implanted 4H-SiC. Ion implantations of Aluminium (Al) at different energies (30…