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cond-mat2003
Non-Gaussianity of resistance fluctuations near electrical breakdown
C. Pennetta, E. Alfinito, L. Reggiani +1
We study the resistance fluctuation distribution of a thin film near electrical breakdown. The film is modeled as a stationary resistor networkunder biased percolation. Depending o…
cond-mat2001
Monte Carlo simulation of electromigration phenomena in metallic lines
C. Pennetta, L. Reggiani, E. Alfinito
The electromigration (EM) of metallic lines is studied in terms of competition between two percolative processes taking place in a random resistor network. The effects associated w…