most citedQuantum communication networks with defects in silicon carbide

6 citations · 6 across the 3 of their papers we have counts for

collaborators

7 papers

cond-mat.mtrl-sci2026

Bond reconstruction and vacancy clustering in monolayer silicon carbide from first principles

Péter Udvarhelyi

Bond reconstruction in vacancy-related structures affects their formation energies, symmetries, and electronic and optical properties. Using density functional theory, we investiga…

cond-mat.mtrl-sci2026

First-principles insights into the atomic structure of carbon-nitrogen-oxygen complex color centers in silicon

Péter Udvarhelyi, Péter Udvarhelyi

Spin-active color centers are the basis of solid-state defect systems utilized in quantum technologies. Although silicon is an emerging host material for quantum defects, there is…

quant-ph20266 cited

Quantum communication networks with defects in silicon carbide

Philipp Sohr, Philipp Koller, Sebastian Ecker +23

Quantum communication promises unprecedented capabilities enabled by the transmission of quantum states of light. However, current implementations face severe distance limitations…

quant-ph2024

Design for telecom-wavelength quantum emitters in silicon based on alkali-metal-saturated vacancy complexes

Péter Udvarhelyi, Prineha Narang

Defect emitters in silicon are promising contenders as building blocks of solid-state quantum repeaters and sensor networks. Here we investigate a family of possible isoelectronic…

cond-mat.mes-hall2024

All epitaxial self-assembly of vertically-confined silicon color centers using ultra-low temperature epitaxy

Johannes Aberl, Enrique Prado Navarrete, Merve Karaman +12

Silicon-based color-centers (SiCCs) have recently emerged as quantum-light sources that can be combined with telecom-range Si Photonics platforms. Unfortunately, using current SiCC…

quant-ph2024

Precise characterization of a silicon carbide waveguide fiber interface

Marcel Krumrein, Raphael Nold, Flavie Davidson-Marquis +13

Emitters in high refractive index materials like 4H-SiC suffer from reduced detection of photons because of losses caused by total internal reflection. Thus, integration into effic…