787 citations · 3.2k across the 72 of their papers we have counts for
79 papers
Review of prototypes developed in a 65 nm CMOS imaging technology in view of vertexing applications at a future lepton collider
Finn King, Matthew Lewis Franks, Yajun He +21
The OCTOPUS project addresses the development and characterization of monolithic active pixel sensors in the TPSCo 65 nm ISC technology in view of vertexing applications at a futur…
Characterization of the H2M Monolithic CMOS Sensor
Rafael Ballabriga, Eric Buschmann, Michael Campbell +29
The H2M (Hybrid-to-Monolithic) is a monolithic pixel sensor manufactured in a modified \SI{65}{\nano\meter}~CMOS imaging process with a small collection electrode. Its design addre…
The Compact Linear ee Collider (CLIC)
Erik Adli, Gerardo D'Auria, Nuria Catalan Lasheras +22
The Compact Linear Collider (CLIC) is a TeV-scale high-luminosity linear ee collider studied by the international CLIC and CLICdp collaborations. CLIC uses a two-beam accel…
Caribou - A versatile data acquisition system for silicon pixel detector prototyping
Younes Otarid, Mathieu Benoit, Eric Buschmann +7
Caribou is a versatile data acquisition system used in multiple collaborative frameworks (CERN EP R&D, DRD3, AIDAinnova, Tangerine) for laboratory and test-beam qualification of no…
Simulating Monolithic Active Pixel Sensors: A Technology-Independent Approach Using Generic Doping Profiles
Håkan Wennlöf, Dominik Dannheim, Manuel Del Rio Viera +17
The optimisation of the sensitive region of CMOS sensors with complex non-uniform electric fields requires precise simulations, and this can be achieved by a combination of electro…
Characterisation of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process
Gianluca Aglieri Rinella, Giacomo Alocco, Matias Antonelli +91
Analogue test structures were fabricated using the Tower Partners Semiconductor Co. CMOS 65 nm ISC process. The purpose was to characterise and qualify this process and to optimise…