most citedSTM characterization of the Si-P heterodimer

44 citations · 44 across the 1 of their papers we have counts for

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1 paper

cond-mat.mtrl-sci2003★ 44 cited

STM characterization of the Si-P heterodimer

N. J. Curson, S. R. Schofield, M. Y. Simmons +3

We use scanning tunneling microscopy (STM) and Auger electron spectroscopy to study the behavior of adsorbed phosphine (PH) on Si(001), as a function of annealing temperature…