15 citations · 41 across the 4 of their papers we have counts for
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Detection of a single-charge defect in a metal-oxide-semiconductor structure using vertically coupled Al and Si single-electron transistors
L. Sun, B. E. Kane
An Al-AlO_x-Al single-electron transistor (SET) acting as the gate of a narrow (~ 100 nm) metal-oxide-semiconductor field-effect transistor (MOSFET) can induce a vertically aligned…
Coulomb blockade in a Si channel gated by an Al single-electron transistor
L. Sun, K. R. Brown, B. E. Kane
We incorporate an Al-AlO_x-Al single-electron transistor as the gate of a narrow (~100 nm) metal-oxide-semiconductor field-effect transistor (MOSFET). Near the MOSFET channel condu…
Electric-field-dependent spectroscopy of charge motion using a single-electron transistor
K. R. Brown, L. Sun, B. E. Kane
We present observations of background charge fluctuators near an Al-AlO_x-Al single-electron transistor on an oxidized Si substrate. The transistor design incorporates a heavily do…
A Millikelvin Scanned Probe for Measurement of Nanostructures
K. R. Brown, L. Sun, B. E. Kane
We demonstrate a scanning force microscope, based upon a quartz tuning fork, that operates below 100 mK and in magnetic fields up to 6 T. The microscope has a conducting tip for el…