activity
20172020
most citedDual-optical-comb spectroscopic ellipsometry

94 citations · 94 across the 1 of their papers we have counts for

collaborators

7 papers

physics.optics2020

Fabrication of three-dimensional high-aspect-ratio structures by oblique-incidence Talbot lithography

Ryu Ezaki, Naoki Ura, Tsutomu Uenohara +3

Developing a suitable production method for three-dimensional periodic nanostructures with high aspect ratios is a subject of growing interest. For mass production, Talbot lithogra…

physics.app-ph2019

Refractive index sensing with temperature compensation by a multimode-interference fiber-based optical frequency comb sensing cavity

Ryo Oe, Takeo Minamikawa, Shuji Taue +7

We proposed a refractive index (RI) sensing method with temperature compensation by using an optical frequency comb (OFC) sensing cavity employing a multimode-interference (MMI) fi…

physics.optics2019

Lock-in-detection dual-comb spectroscopy

Hidenori Koresawa, Kyuki Shibuya, Takeo Minamikawa +9

Dual-comb spectroscopy (DCS) is useful for gas spectroscopy due to high potential of optical frequency comb (OFC). However, fast Fourier transform (FFT) calculation of a huge amoun…

physics.app-ph2018

Multicascade-linked synthetic wavelength digital holography using an optical-comb-referenced frequency synthesizer

Masatomo Yamagiwa, Takeo Minamikawa, Clément Trovato +11

Digital holography (DH) is a promising method for non-contact surface topography because the reconstructed phase image can visualize the nanometer unevenness in a sample. However,…

physics.app-ph2018

Refractive-index-sensing radio-frequency comb with intracavity multi-mode interference fibre sensor

Roy Oe, Shuji Taue, Takeo Minamikawa +8

Optical frequency combs have attracted attention as optical frequency rulers due to their tooth-like discrete spectra together with their inherent mode-locking nature and phase-loc…

physics.ins-det201794 cited

Dual-optical-comb spectroscopic ellipsometry

Takeo Minamikawa, Yi-Da Hsieh, Kyuki Shibuya +8

Spectroscopic ellipsometry is a means to investigate optical and dielectric material responses. Conventional spectroscopic ellipsometry has trade-offs between spectral accuracy, re…