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Chip-integrated voltage sources for control of trapped ions
J. Stuart, R. Panock, C. D. Bruzewicz +5
Trapped-ion quantum information processors offer many advantages for achieving high-fidelity operations on a large number of qubits, but current experiments require bulky external…
Evidence for multiple mechanisms underlying surface electric-field noise in ion traps
J. A. Sedlacek, J. Stuart, D. H. Slichter +4
Electric-field noise from ion-trap electrode surfaces can limit the fidelity of multiqubit entangling operations in trapped-ion quantum information processors and can give rise to…
Method for Determination of Technical Noise Contributions to Ion Motional Heating
J. A. Sedlacek, J. Stuart, W. Loh +4
Microfabricated Paul ion traps show tremendous promise for large-scale quantum information processing. However, motional heating of ions can have a detrimental effect on the fideli…