collaborators

1 paper

cond-mat.other2005

X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling

H. Ott, C. Schuessler-Langeheine, E. Schierle +5

Quantitative analyses of x-ray scattering from thin films of Ho and Dy metal at the M_5 resonances result in values of the optical constants and the magnetic scattering lengths f_m…