activity
20142023
most citedThe impact of stochastic incorporation on atomic-precision Si:P arrays

28 citations · 127 across the 12 of their papers we have counts for

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Showing cond-mat.mtrl-sciShow all

5 papers · 1 filter

cond-mat.mtrl-sci2023★ 25 cited

Utilizing multimodal microscopy to reconstruct Si/SiGe interfacial atomic disorder and infer its impacts on qubit variability

Luis Fabián Peña, Justine C. Koepke, J. Houston Dycus +4

SiGe heteroepitaxial growth yields pristine host material for quantum dot qubits, but residual interface disorder can lead to qubit-to-qubit variability that might pose an obstacle…

cond-mat.mtrl-sci2021★ 1 cited

Atomic step disorder on polycrystalline surfaces leads to spatially inhomogeneous work functions

Morgann Berg, Sean W. Smith, David A. Scrymgeour +11

Structural disorder causes materials surface electronic properties, e.g. work function () to vary spatially, yet it is challenging to prove exact causal relationships to underly…

cond-mat.mtrl-sci2021★ 21 cited

AlCl-dosed Si(100)-21: Adsorbates, chlorinated Al chains, and incorporated Al

Matthew S. Radue, Sungha Baek, Azadeh Farzaneh +8

The adsorption of AlCl on Si(100) and the effect of annealing the AlCl-dosed substrate was studied to reveal key surface processes for the development of atomic-precisi…

cond-mat.mtrl-sci2020

A model for atomic precision p-type doping with diborane on Si(100)-21

Quinn Campbell, Jeffrey A. Ivie, Ezra Bussmann +3

Diborane (BH) is a promising molecular precursor for atomic precision p-type doping of silicon that has recently been experimentally demonstrated [T. {Š}kere{ň}, \textit{et…

cond-mat.mtrl-sci2014★ 2 cited

Imaging and registration of buried atomic-precision donor devices using scanning capacitance microscopy

E. Bussmann, M. Rudolph, G. S. Subramania +7

We show that a scanning capacitance microscope (SCM) can image buried delta-doped donor nanostructures fabricated in Si via a recently developed atomic-precision scanning tunneling…