Investigation of the Casimir force between metal and semiconductor test bodies

Abstract

The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be significantly different than between two similar or dissimilar metals.

9 pages, 3 figures; minor abbreviations in the text were made; accepted for publication in Phys. Rev. A (Rapid Communications)

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• Improved tests of extra-dimensional physics and thermal quantum field theory from new Casimir force measurements
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