Ellipsometric measurements by use of photon pairs generated by spontaneous parametric down-conversion

Abstract

We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.

10 pages, accepted for publication in Optics Letters

References in corpus (1)

• Degree of entanglement for two qubits

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