On the characterisation of a Bragg spectrometer with X-rays from an ECR source
arXiv:physics/0408081 · doi:10.1016/j.nima.2005.01.311
Abstract
Narrow X-ray lines from helium-like argon emitted from a dedicated ECR source have been used to determine the response function of a Bragg crystal spectrometer equipped with large area spherically bent silicon (111) or quartz (10) crystals. The measured spectra are compared with simulated ones created by a ray-tracing code based on the expected theoretical crystal's rocking curve and the geometry of the experimental set-up.
Version acceptee (NIM)
Cited by in corpus (9)
- Pionic deuterium
- Hadronic shift in pionic hydrogen
- Precision determination of the dpi -> NN transition strength at threshold
- Line shape of the muH(3p - 1s) hyperfine transitions
- Highly charged ion X-rays from Electron-Cyclotron Resonance Ion Sources
- Line shape analysis of the K transition in muonic hydrogen
- Measurement of the charged pion mass using a low-density target of light atoms
- From heavy ions to exotic atoms
- A vacuum double-crystal spectrometer for reference-free highly charged ions X-ray spectroscopy