Glass Transition Temperature and Dynamics of -Process in Thin Polymer Films
arXiv:cond-mat/9810171 · doi:10.1209/epl/i1999-00309-6
Abstract
The glass transition temperature and the temperature corresponding to the peak in the dielectric loss due to the -process have been simultaneously determined as functions of film thickness through dielectric measurements for thin films of polystyrene. A decrease of was observed with decreasing film thickness, while was found to remain almost constant for and decrease drastically for . Here, is a critical thickness dependent on molecular weight. The thickness dependence of is related to the distribution of relaxation times of the -process, not to the relaxation time itself.
4 pages, 4 figures
References in corpus (2)
Cited by in corpus (7)
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