Shot noise in diffusive conductors: A quantitative analysis of electron-phonon interaction effects
arXiv:cond-mat/9803335 · doi:10.1103/PhysRevB.58.15371
Abstract
Using the 'drift-diffusion-Langevin' equation, we have quantitatively analyzed the effects of electron energy relaxation via their interaction with phonons, generally in presence of electron-electron interaction, on shot noise in diffusive conductors. We have found that the noise power (both at low and high observation frequencies ) drops to half of its 'mesoscopic' value only at where is the ratio of the sample length to the energy relaxation length $l_{% {\rm ph}}$ (the latter may be much larger then the dephasing length). It means in particular that at low temperatures the shot noise may be substantial even when -- cm, and the conductor is 'macroscopic' in any other respect.
4 pages, 3 figures
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