Charge modulations vs. strain waves in resonant x-ray scattering

Abstract

A method is described for using resonant x-ray scattering to separately quantify the charge (valence) modulation and the strain wave associated with a charge density wave. The essence of the method is a separation of the atomic form factor into a "raw" amplitude, fR(w), and a valence-dependent amplitude, fD(w), which in many cases may be determined independently from absorption measurements. The advantage of this separation is that the strain wave follows the quantity |fR(w) + <v> fD(w)|^2 whereas the charge modulation follows only |fD(w)|^2. This allows the two distinct modulations to be quantified separately. A scheme for characterizing a given CDW as Peierls-like or Wigner-like naturally follows. The method is illustrated for an idealized model of a one-dimensional chain.

6 pages, 4 figures

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• Spatially modulated "Mottness" in La2-xBaxCuO4
• Hole crystallization in the spin ladder of Sr14Cu24O41
• Direct observation of orbital ordering in La${}_{0.5}$Sr${}_{1.5}$MnO${}_4$ using soft x-ray diffraction
• Soft x-ray resonant diffraction study of magnetic and orbital correlations in a manganite near half-doping
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