Superconductor-metal transition in an ultrasmall Josephson junction biased by a noisy voltage source
arXiv:cond-mat/0607636 · doi:10.1103/PhysRevLett.98.030601
Abstract
Shot noise in a voltage source changes the character of the quantum (dissipative) phase transition in an ultrasmall Josephson junction: The superconductor-insulator transition transforms into the superconductor-metal transition. In the metallic phase the IV curve probes the voltage distribution generated by shot noise, whereas in the superconducting phase it probes the counting statistics of electrons traversing the noise junction.
arXiv comment4 pages, 3 figures. Corrected typos and style, added references
References in corpus (21)
- Shot Noise in Mesoscopic Conductors
- Electron Counting Statistics and Coherent States of Electric Current
- Double Quantum Dots as Detectors of High-Frequency Quantum Noise in Mesoscopic Conductors
- Environmental effects in the third moment of voltage fluctuations in a tunnel junction
- Electron shot noise beyond the second moment
- Detection of Quantum Noise from an Electrically-Driven Two-Level System
- Measurement of Counting Statistics of Electron Transport in a Tunnel Junction
- Josephson junctions as threshold detectors for full counting statistics
- Temperature dependent third cumulant of tunneling noise
- A Josephson junction as a detector of Poissonian charge injection
- Charge transfer counting statistics revisited
- Effect of zero point phase fluctuations on Josephson tunneling
- Shot-noise-driven escape in hysteretic Josephson junctions
- Measuring non-Gaussian fluctuations through incoherent Cooper pair current
- Observation of shot-noise-induced asymmetry in the Coulomb blockaded Josephson junction
- How to detect the fourth order cumulant of electrical noise
- Shot Noise at High Temperatures
- Effect of the shot-noise on a Coulomb blockaded single Josephson junction
- Qubits as devices to detect the third moment of current fluctuations
- Control of Coulomb blockade in a mesoscopic Josephson junction using single electron tunneling
- Statistics of electron tunneling in normal tunnel junctions