Statistics of electron tunneling in normal tunnel junctions
arXiv:cond-mat/0604479 · doi:10.1103/PhysRevB.74.195322
Abstract
Statistics of electron tunneling in normal tunnel junctions is studied analytically and numerically taking into account circuit (environment) effects. Full counting statistics, as well as full statistics of voltage and phase have been found for arbitrary times of observation. The theoretical analysis was based on the classical master equation, whereas the numerical simulations employed standard Monte-Carlo methods.
17 pages, 4 figures
References in corpus (13)
- Shot Noise in Mesoscopic Conductors
- Full Counting Statistics of Charge Transfer in Coulomb Blockade Systems
- Environmental effects in the third moment of voltage fluctuations in a tunnel junction
- Measurement of Counting Statistics of Electron Transport in a Tunnel Junction
- Josephson junctions as threshold detectors for full counting statistics
- Cascade Boltzmann - Langevin approach to higher-order current correlations in diffusive metal contacts
- A Josephson junction as a detector of Poissonian charge injection
- Distribution of transmitted charge through a double-barrier junction
- Shot-noise-driven escape in hysteretic Josephson junctions
- Observation of shot-noise-induced asymmetry in the Coulomb blockaded Josephson junction
- How to detect the fourth order cumulant of electrical noise
- Distribution of voltage fluctuations in a current-biased conductor
- Effect of the shot-noise on a Coulomb blockaded single Josephson junction