Current Flow in Random Resistor Networks: The Role of Percolation in Weak and Strong Disorder

Abstract

We study the current flow paths between two edges in a random resistor network on a $L\times L$ square lattice. Each resistor has resistance $e^{ax}$, where $x$ is a uniformly-distributed random variable and $a$ controls the broadness of the distribution. We find (a) the scaled variable $u\equiv L/a^{\nu }$, where $\nu$ is the percolation connectedness exponent, fully determines the distribution of the current path length $\ell$ for all values of $u$. For $u\gg 1$, the behavior corresponds to the weak disorder limit and $\ell$ scales as $\ell \sim L$, while for $u\ll 1$, the behavior corresponds to the strong disorder limit with $\ell \sim L^{d_{opt}}$, where $d_{opt}=1.22\pm 0.01$ is the optimal path exponent. (b) In the weak disorder regime, there is a length scale $\xi \sim a^{\nu }$, below which strong disorder and critical percolation characterize the current path.

9 pages, 4 figures

References in corpus (3)

• Optimal Paths in Disordered Complex Networks
• Effect of Disorder Strength on Optimal Paths in Complex Networks
• Phase Diagram of Optimal Paths

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