Response of random field Ising model driven by an external field
arXiv:cond-mat/0401414 · doi:10.1142/S0217979203023161
Abstract
We study the dynamics of spin flipping at first order transitions in zero temperature two-dimensional random-field Ising model driven by an external field. We find a critical value of the disorder strength at which a discontinuous sharp jump in magnetization first occurs. We discuss growth morphology of the flipped-spin domains at and away from criticality.
Paper presented at the Discussion Meeting on Statistical Mechanics of Threshold Activated Systems,IMSC, Chennai, India (March 2003)
References in corpus (5)
- Dynamic transitions and hysteresis
- Exact Solution of Return Hysteresis Loops in One Dimensional Random Field Ising Model at Zero Temperature
- Exact Expressions for Minor Hysteresis Loops in the Random Field Ising Model on a Bethe Lattice at Zero Temperature
- Distribution of Avalanche Sizes in the Hysteretic Response of Random Field Ising Model on a Bethe Lattice at Zero Temperature
- Dynamic criticality in driven disordered systems: Role of depinning and driving rate in Barkhausen noise