Circuit with small-capacitance high-quality Nb Josephson junctions
arXiv:cond-mat/0311332 · doi:10.1063/1.1640798
Abstract
We have developed a fabrication process for nanoscale tunnel junctions which includes focused-ion-beam etching from different directions. By applying the process to a Nb/(Al-)Al_2O_3/Nb trilayer, we have fabricated a Nb single-electron transistor (SET), and characterized the SET at low temperatures, T=0.04-40 K. The superconducting gap energy and the transition temperature of the Nb SET agree with the bulk values, which suggests high quality Nb junctions. The single-electron charging energy of the SET is estimated to be larger than 1 K.
Published version, RevTeX4
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Cited by in corpus (5)
- Single-charge devices with ultrasmall Nb/AlOx/Nb trilayer Josephson junctions
- Parity effect in Al and Nb single electron transistors in a tunable environment
- Periodicity in Al/Ti superconducting single electron transistors
- Anodization-free fabrication process for high-quality cross-type Josephson tunnel junctions based on a Nb/Al-AlO/Nb trilayer
- Method for finding the critical temperature of the island in a SET structure