Anomalous Phase Transition in Strained SrTiO Thin Films
arXiv:cond-mat/0303317 · doi:10.1063/1.1589186
Abstract
We have studied the cubic to tetragonal phase transition in epitaxial SrTiO films under various biaxial strain conditions using synchrotron X-ray diffraction. Measuring the superlattice peak associated with TiO octahedra rotation in the low temperature tetragonal phase indicates the presence of a phase transition whose critical temperature is a strong function of strain, with T as much as 50K above the corresponding bulk temperature. Surprisingly, the lattice constants evolve smoothly through the transition with no indication of a phase change. This signals an important change in the nature of the phase transition due to the epitaxy strain and substrate clamping effect. The internal degrees of freedom (TiO rotations) have become uncoupled from the overall lattice shape.
4 pages, 3 figures, REVTeX 4