The superconducting gap of \QTR{em}{in situ} thin films by microwave surface impedance measurements
arXiv:cond-mat/0212009 · doi:10.1063/1.1517181
Abstract
Precision measurements of the microwave surface resistance of in situ films directly reveal an exponential behavior of at low temperature indicating a fully-gapped order parameter. The entire temperature dependence of is well described by a Mattis-Bardeen formalism but with a small gap ratio of , corresponding to .
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