paper

The superconducting gap of \QTR{em}{in situ} thin films by microwave surface impedance measurements

arXiv:cond-mat/0212009 · doi:10.1063/1.1517181

Abstract

Precision measurements of the microwave surface resistance of in situ films directly reveal an exponential behavior of at low temperature indicating a fully-gapped order parameter. The entire temperature dependence of is well described by a Mattis-Bardeen formalism but with a small gap ratio of , corresponding to .