Phase transitions, stability, and dielectric response of the domain structure in ferroelectric-ferroelastic thin films
arXiv:cond-mat/0010098 · doi:10.1103/PhysRevLett.86.3642
Abstract
We present the first analytical study of phase transitions in ferroelastic-ferroelectric epitaxial thin films on exactly solvable model. The emerging domain structure with domains of equal width (which may be exponentially large on a "soft" substrate) always remains stable irrespective of the film thickness. The dielectric response of an epitaxial film is {\em smaller} than that of a free film, in striking contrast with assertions in the literature.
5 pages, REVTeX 3.1 with one eps-figure
References in corpus (3)
Cited by in corpus (9)
- Physics of thin-film ferroelectric oxides
- Fractal dimension and size scaling of domains in thin films of multiferroic BiFeO3
- Ferroelectric Phase Transitions in Ultra-thin Films of BaTiO3
- Formation and rapid evolution of domain structure at phase transitions in slightly inhomogeneous ferroelectrics and ferroelastics
- Specific heat and heat conductivity of the BaTiO3 polycrystalline films with the thickness in the range 20 - 1100 nm
- Periodicity doubling cascades: direct observation in ferroelastic materials
- Phase Diagrams and Domain Splitting in Thin Ferroelectric Films with Incommensurate Phases
- Proper ferroelastic phase transitions in thin epitaxial films with symmetry-conserving and symmetry-breaking misfit strains
- Negative bulk modulus and possibility of loss of elastic stability near tricritical transitions in thin films on substrates