Fresnel diffraction imaging of surface nanostructure using coherent resonant X-ray scattering

Abstract

We investigated surface nanostructures on an antiferromagnet MnBi${}_2$Te${}_4$ using a novel imaging technique, direct (real)-space and real time coherent X-ray imaging (direct-CXI). This technique has provided new insights into antiferromagnetic textures, including the formation of anti-phase antiferromagnetic (AFM) domains and thermal dynamics of AFM domains and domain walls. While this method produces real-space images of AFM textures without requiring a complex imaging retrieval process, its underlying imaging mechanism has not been fully understood, limiting a deep understanding of AFM textures and the information they contain. By investigating the well-defined structural characteristics of the nanostructures fabricated on MnBi${}_2$Te${}_4$, we elucidate the imaging principle of this novel technique. We find that the observed images can be well explained by Fresnel diffraction integral. Using a simple model from classical optics, our calculations successfully reproduce the experimentally observed images of the nanostructures. This demonstrates that direct-CXI not only provides straightforward real-space imaging but also contains phase information through its Fresnel diffraction integral.

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