Flux trapping in NbTiN strips
arXiv:2503.14457 · doi:10.1103/b9sm-nl9c
Abstract
We use scanning superconducting quantum interference device (SQUID) microscopy to image individual vortices in superconducting strips fabricated from NbTiN thin films. By repeatedly field-cooling strips of different widths in applied magnetic fields, we extract the threshold field at which the first vortex enters a strip, as well as the number and spatial configuration of vortices beyond this threshold. We model vortex behavior with and without considering the effect of pinning by numerically minimizing the Gibbs free energy of vortices in the strips. Our measurements provide a first experimental benchmark for understanding the flux trapping properties of NbTiN thin films, directly relevant to NbTiN-based superconducting circuits and devices.
References in corpus (9)
- Scanning SQUID susceptometers with sub-micron spatial resolution
- Vortex trapping and expulsion in thin-film YBCO strips
- Interaction of vortices in thin superconducting films and Berezinskii-Kosterlitz-Thouless transition
- Transverse instabilities of multiple vortex chains in superconductor-ferromagnet bilayers
- Matching fields of a long superconducting film
- Imaging pinning and expulsion of individual superconducting vortices in amorphous MoSi thin films
- Vortex trapping and expulsion in thin-film type-II superconducting strips
- Properties of Nb\_xTi\_{(1-x)}N thin films deposited on 300 mm silicon wafers for upscaling superconducting digital circuits
- Flux-trapping characterization for superconducting electronics using a cryogenic widefield N- diamond microscope