Entropy density benchmarking of near-term quantum circuits

Abstract

Understanding the limitations imposed by noise on current and next-generation quantum devices is a crucial step toward demonstrating practical quantum advantage. In this work, we investigate the accumulation of entropy density as a benchmark to monitor the performance of quantum processing units (QPUs). We provide a proof-of-principle demonstration of our methodology which entails developing simple heuristic models of how entropy accumulates, testing them against real QPU data, and finally using these models to determine a circuit volume threshold above which quantum advantage is unattainable. Monitoring entropy density not only offers an alternative approach that complements existing circuit-level benchmarking techniques, but, more importantly, it bridges the gap between circuit-level and application-level benchmarking protocols. In particular, our heuristic model of entropy accumulation allows us to outperform existing techniques that bound the circuit-size threshold for quantum advantage.

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