Temperature and Electron Concentration Dependences of 1/f Noise in Hg${}_{1-x}$Cd${}_x$Te -- Evidence for a Mobility Fluctuations Mechanism

Abstract

Hg${}_{1-x}$Cd${}_x$Te is a unique material with the band-gap tunable by the temperature, pressure, and cadmium content in a wide range, from 1.6 eV to inverted band-gap of -0.3 eV. This makes Hg${}_{1-x}$Cd${}_x$Te one of the key materials for infrared and terahertz detectors, whose characteristics largely depend on the material noise properties. In this work, we investigated the low-frequency 1/f noise in a thick (800 nm) HgCdTe layer and in a field effect transistor (FET) with an 8 nm wide HgTe quantum well. Both structures exhibited a small contribution from contact noise and showed weak noise dependences on temperature. Investigation of the 1/f noise in HgTe quantum well FET as a function of gate voltage revealed that the noise also depends weakly on electron concentration. These findings indicate that the noise properties of Hg${}_{1-x}$Cd${}_x$Te are similar to those of graphene, where mobility fluctuations were found to be the dominant mechanism of the 1/f noise.

19 pages, 3 figures (4 panel in each figures)