Light Dark Matter Constraints from SuperCDMS HVeV Detectors Operated Underground with an Anticoincidence Event Selection

Abstract

This article presents constraints on dark-matter-electron interactions obtained from the first underground data-taking campaign with multiple SuperCDMS HVeV detectors operated in the same housing. An exposure of 7.63 g-days is used to set upper limits on the dark-matter-electron scattering cross section for dark matter masses between 0.5 and 1000 MeV/$c^2$, as well as upper limits on dark photon kinetic mixing and axion-like particle axioelectric coupling for masses between 1.2 and 23.3 eV/$c^2$. Compared to an earlier HVeV search, sensitivity was improved as a result of an increased overburden of 225 meters of water equivalent, an anticoincidence event selection, and better pile-up rejection. In the case of dark-matter-electron scattering via a heavy mediator, an improvement by up to a factor of 25 in cross-section sensitivity was achieved.

7 pages + title and references, 4 figures, and 1 table

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Cited by in corpus (12)

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• Low-Energy Calibration of SuperCDMS HVeV Cryogenic Silicon Calorimeters Using Compton Steps
• Bayesian technique to combine independently-trained Machine-Learning models applied to direct dark matter detection
• Search for low-mass electron-recoil dark matter using a single-charge sensitive SuperCDMS-HVeV Detector
• Dark Matter Internal Pair Production -- A Novel Direct Detection Mechanism
• A general upper bound on the light dark matter scattering rate in materials
• Bayesian network 3D event reconstruction in the Cygno optical TPC for dark matter direct detection
• State of the Art in Direct Dark Matter Detectors: Technologies, Performance, and Future Directions
• A nonlinear multiphysics model for the design validation of the ASTAROTH copper-steel cryogenic chamber
• Constraints on sub-GeV dark matter scattering on electrons with COSINE-100
• Removal of spallation-induced tritium from silicon through diffusion
• Performance of a SuperCDMS HVeV Detector with Sub-eV Energy Resolution and Single Charge-sensitivity