Aluminum Relaxation as the Source of Excess Low Energy Events in Low Threshold Calorimeters
arXiv:2406.15425 · doi:10.1063/5.0222654
Abstract
A previously unexplained background called the Low Energy Excess (LEE) has negatively impacted the reach of a variety of low threshold calorimeters including light dark matter direct detection and coherent elastic neutrino-nucleus scattering experiments. The relaxation of stressed aluminium films as mediated by the motion of dislocations may account for these observations.
arXiv comment11 pages, 6 figures
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Cited by in corpus (7)
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- Low Energy Backgrounds and Excess Noise in a Two-Channel Low-Threshold Calorimeter
- Low-Energy Backgrounds in Solid-State Phonon and Charge Detectors
- A Transition Edge Sensor Operated in Coincidence with a High Sensitivity Athermal Phonon Sensor for Photon Coupled Rare Event Searches
- Low-Energy Calibration of SuperCDMS HVeV Cryogenic Silicon Calorimeters Using Compton Steps
- Spontaneous generation of athermal phonon bursts within bulk silicon causing excess noise, low energy background events and quasiparticle poisoning in superconducting sensors
- Spontaneous damage annealing reactions as a possible source of low energy excess in semiconductor detectors