Time-resolved force microscopy using delay-time modulation method
arXiv:2401.06359 · doi:10.35848/1882-0786/ad0c04
Abstract
We developed a time-resolved force microscopy technique by integrating atomic force microscopy using a tuning-fork-type cantilever with the delay time modulation method for optical pump-probe light. We successfully measured the dynamics of surface recombination and diffusion of photoexcited carriers in bulk WSe2, which is challenging owing to the effect of tunneling current in time-resolved scanning tunneling microscopy. The obtained results were comprehensively explained with the model based on the dipole-dipole interaction induced by photo illumination.
13 pages, 4 figures