Magnetic penetration depth of Aluminum thin films
arXiv:2311.14119 · doi:10.1088/1361-6668/adf360
Abstract
We present a study of the superconducting penetration depth in aluminum thin films of varying thickness. The range of thicknesses chosen spans from the thin-film regime to the regime approaching bulk behavior. The penetration depths observed range from for the thinnest samples down to for the -thick ones. In order to accurately determine , we performed complementary measurements using the frequency of superconducting resonators as well as the resistance of normal-state meanders. Both methods yield comparable results, providing a well-characterized set of values of in aluminum in the relevant range for applications in fields such as quantum computing and microwave radiation detector technologies.
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