paper

Growth, catalysis and faceting of -GaO and -(InGa)O on -plane -AlO by molecular beam epitaxy

arXiv:2311.12460 · doi:10.1063/5.0180041

Abstract

The growth of -GaO and -(InGa)O on -plane -AlO(100) by molecular beam epitaxy (MBE) and metal-oxide-catalyzed epitaxy (MOCATAXY) is investigated. By systematically exploring the parameter space accessed by MBE and MOCATAXY, phase-pure -GaO(100) and -(InGa)O(100) thin films are realized. The presence of In on the -GaO growth surface remarkably expands its growth window far into the metal-rich flux regime and to higher growth temperatures. With increasing O-to-Ga flux ratio (), In incorporates into -(InGa)O up to . Upon a critical thickness, -(InGa)O nucleates and subsequently heteroepitaxially grows on top of -(InGa)O facets. Metal-rich MOCATAXY growth conditions, where -GaO would not conventionally stabilize, lead to single-crystalline -GaO with negligible In incorporation and improved surface morphology. Higher further results in single-crystalline -GaO with well-defined terraces and step edges at their surfaces. For , In acts as a surfactant on the -GaO growth surface by favoring step edges, while for , In incorporates and leads to a-plane -(InGa)O faceting and the subsequent (01) -(InGa)O growth on top. Thin film analysis by STEM reveals highly crystalline -GaO layers and interfaces. We provide a phase diagram to guide the MBE and MOCATAXY growth of single-crystalline -GaO on -AlO(100).

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