Hyperspectral photoluminescence and reflectance microscopy of 2D materials

Abstract

Optical micro-spectroscopy is an invaluable tool for studying and characterizing samples ranging from classical semiconductors to low-dimensional materials and heterostructures. To date, most implementations are based on point-scanning techniques, which are flexible and reliable, but slow. Here, we describe a setup for highly parallel acquisition of hyperspectral reflection and photoluminescence microscope images using a push-broom technique. Spatial as well as spectral distortions are characterized and their digital corrections are presented. We demonstrate close-to diffraction-limited spatial imaging performance and a spectral resolution limited by the spectrograph. The capabilities of the setup are demonstrated by recording a hyperspectral photoluminescence map of a CVD-grown MoSe${}_2$-WSe${}_2$ lateral heterostructure, from which we extract the luminescence energies, intensities and peak widths across the interface.

References in corpus (16)

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• Valley polarization in MoS2 monolayers by optical pumping
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• Disentangling the effects of doping, strain and defects in monolayer WS2 by optical spectroscopy
• Unveiling valley lifetimes of free charge carriers in monolayer WSe${}_2$
• Exciton spectroscopy and diffusion in MoSe2-WSe2 lateral heterostructures encapsulated in hexagonal boron nitride
• Tailoring the dielectric screening in WS${}_2$-graphene heterostructures

Cited by in corpus (2)

• Distance dependence of the energy transfer mechanism in WS${}_2$-graphene heterostructures
• Electrically Controlled Interfacial Charge Transfer Induced Excitons in MoSe2-WSe2 Lateral Heterostructure