Interfacial and Surface Magnetism in Epitaxial NiCo2O4(001)/MgAl2O4 Films
arXiv:2302.11744 · doi:10.1063/5.0152539
Abstract
NiCo2O4 (NCO) films grown on MgAl2O4 (001) substrates have been studied using magnetometry, x-ray magnetic circular dichroism (XMCD) based on x-ray absorption spectroscopy, and spin-polarized inverse photoemission spectroscopy (SPIPES) with various thickness down to 1.6 nm. The magnetic behavior can be understood in terms of a layer of optimal NCO and an interfacial layer (1.2+/- 0.1 nm), with a small canting of magnetization at the surface. The thickness dependence of the optimal layer can be described by the finite-scaling theory with a critical exponent consistent with the high perpendicular magnetic anisotropy. The interfacial layer couples antiferromagnetically to the optimal layer, generating exchange-spring styled magnetic hysteresis in the thinnest films. The non-optimal and measurement-speed-dependent magnetic properties of the interfacial layer suggest substantial interfacial diffusion.
References in corpus (6)
- Critical thickness and orbital ordering in ultrathin La0.7Sr0.3MnO3 films
- Perpendicular Magnetic Anisotropy in Conducting NiCo2O4 Films from Spin-Lattice Coupling
- Perspective on Epitaxial NiCo2O4 Film as an Emergent Spintronic Material: Magnetism and Transport Properties
- Spin and orbital magnetic moments in perpendicularly magnetized NiCoO epitaxial thin films: Effects of site-dependent cation valence states
- Magnetization Reversal Mechanism in Exchange-Biased Spring-like Thin-Film Composite
- Anomalous Hall Effect and Perpendicular Magnetic Anisotropy in Ultrathin Ferrimagnetic NiCoO Films