Extraordinary-log Universality of Critical Phenomena in Plane Defects

Abstract

The recent discovery of the extraordinary-log (E-Log) criticality is a celebrated achievement in modern critical theory and calls for generalization. Using large-scale Monte Carlo simulations, we study the critical phenomena of plane defects in three- and four-dimensional O($n$) critical systems. In three dimensions, we provide the first numerical proof for the E-Log criticality of plane defects. In particular, for $n=2$, the critical exponent $\hat{q}$ of two-point correlation and the renormalization-group parameter $\alpha$ of helicity modulus conform to the scaling relation $\hat{q}=(n-1)/(2\pi \alpha )$, whereas the results for $n\ge 3$ violate this scaling relation. In four dimensions, it is strikingly found that the E-Log criticality also emerges in the plane defect. These findings have numerous potential realizations and would boost the ongoing advancement of conformal field theory.

24 pages, 11 figures, including supplemental material. v2: expanded version. To appear in Physical Review Letters

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Cited by in corpus (8)

• Quantum phase transition between topologically distinct quantum critical points
• Universal finite-size scaling in the extraordinary-log boundary phase of three-dimensional $O(N)$ model
• Boundary and defect criticality in topological insulators and superconductors
• Boundary phase transitions of two-dimensional quantum critical XXZ model
• Accurate boundary bootstrap for the three-dimensional O($N$) normal universality class
• Boundary operator product expansion coefficients of the three-dimensional Ising universality class
• Post-measurement Quantum Monte Carlo
• Long-Range Order in a Strictly Short-Range Quasi-2D XY Model: When Critical Fluctuations Matter