Low-coherence interferometric measurement of the spectral dependence of the light field backscattered by optical interfaces
arXiv:2301.09085 · doi:10.1063/5.0139822
Abstract
In this paper, we show how the combined use of low coherence interferometry, balanced detection and data processing comparable to that used in Fourier transform spectrometry allows us to characterize with ultimate resolutions (sub-ppm in level, 0.2 nm in wavelength and 5 mdeg in angle) the retro-reflection and retro-scattering response of both sides of a 2 mm thick silica wafer.
References in corpus (4)
- Large-angle scattered light measurements for quantum-noise filter cavity design studies
- End benches scattered light modeling and subtraction in Advanced Virgo
- Low coherence interferometric detection of the spectral dependence of the retro-reflection coefficient of an anti-reflective coated interface
- A high angular resolution interferometric backscatter meter