Cryogenic probe for low-noise, high-frequency electronic measurements
arXiv:2209.03400 · doi:10.1063/5.0106239
Abstract
The design and performance of a low-noise, modular cryogenic probe, applicable to a wide range of measurements over a broad range of working frequencies, temperatures, and magnetic fields is presented. The design of the probe facilitates the exchange of sample holders and sample-stage amplifiers, which, combined with its characteristic low transmission and reflection loss, make this design suitable for high precision or low sensitivity measurements. The specific example of measuring the shot noise of magnetic tunnel junctions is discussed. We highlight various design characteristics chosen specifically to expand the applicability of the probe to measurement techniques such as nuclear magnetic resonance (NMR).
arXiv comment6 pages, 4 figures. The following article has been accepted by Review of Scientific Instruments. After it is published, it will be found at https://aip.scitation.org/journal/rsi
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