A randomized benchmarking suite for mid-circuit measurements

Abstract

Mid-circuit measurements are a key component in many quantum information computing protocols, including quantum error correction, fault-tolerant logical operations, and measurement based quantum computing. As such, techniques to quickly and efficiently characterize or benchmark their performance are of great interest. Beyond the measured qubit, it is also relevant to determine what, if any, impact mid-circuit measurement has on adjacent, unmeasured, spectator qubits. Here, we present a mid-circuit measurement benchmarking suite developed from the ubiquitous paradigm of randomized benchmarking. We show how our benchmarking suite can be used to both detect as well as quantify errors on both measured and spectator qubits, including measurement-induced errors on spectator qubits and entangling errors between measured and spectator qubits. We demonstrate the scalability of our suite by simultaneously characterizing mid-circuit measurement on multiple qubits from an IBM Quantum Falcon device, and support our experimental results with numerical simulations. Further, using a mid-circuit measurement tomography protocol we establish the nature of the errors identified by our benchmarking suite.

28 pages, 10 figures

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• Benchmarking quantum computers
• High-fidelity, multi-qubit generalized measurements with dynamic circuits
• Error suppression by a virtual two-qubit gate
• A generalized cycle benchmarking algorithm for characterizing mid-circuit measurements
• Pauli Noise Learning for Mid-Circuit Measurements
• Probing Quantum Telecloning on Superconducting Quantum Processors
• Dynamic quantum circuit compilation
• Randomized Benchmarking Protocol for Dynamic Circuits
• Efficient Generation of Multi-partite Entanglement between Non-local Superconducting Qubits using Classical Feedback
• Characterizing physical and logical errors in a transversal CNOT via cycle error reconstruction
• Violation of no-signaling on a public quantum computer