Simplified feedback control system for Scanning Tunneling Microscopy
arXiv:2204.13011 · doi:10.1063/5.0064511
Abstract
A Scanning Tunneling Microscope (STM) is one of the most important scanning probe tools available to study and manipulate matter at the nanoscale. In a STM, a tip is scanned on top of a surface with a separation of a few Å. Often, the tunneling current between tip and sample is maintained constant by modifying the distance between the tip apex and the surface through a feedback mechanism acting on a piezoelectric transducer. This produces very detailed images of the electronic properties of the surface. The feedback mechanism is nearly always made using a digital processing circuit separate from the user computer. Here we discuss another approach, using a computer and data acquisition through the USB port. We find that it allows succesful ultra low noise studies of surfaces at cryogenic temperatures. We show results on different compounds, a type II Weyl semimetal (WTe), a quasi two-dimensional dichalcogenide superconductor (2H-NbSe), a magnetic Weyl semimetal (CoSnS) and an iron pnictide superconductor (FeSe).
arXiv commentInstrumentation paper
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