Transient Characteristics of -GaO Nanomembrane Schottky Barrier Diodes on Various Substrates
arXiv:2202.11179 · doi:10.1088/1361-6463/ac7f67
Abstract
In this paper, a transient delayed rising and fall time of -GaO NMs Schottky barrier diodes (SBDs) formed on four different substrates (diamond, Si, sapphire, and polyimide) were measured using a sub-micron second resolution time-resolved electrical measurement system under a different temperature condition. The devices exhibited noticeably less-delayed turn-on-/off- the transient time when -GaO NMs SBDs were transfer-printed on a high-k substrate. Furthermore, a relationship between the -GaO NM thicknesses and their transient characteristics were systematically investigated and found that phonon scattering plays an important role in heat dissipation as the thickness of -GaO NMs get thinner which is also verified by the Multiphysics simulator. Overall, our result reveals the impact of various substrates with different thermal properties and different \b{eta}- Ga2O3 NMs thickness with the performance of -GaO NMs based devices. Hence, these results can guide further efforts us to optimize the performance of future -GaO devices by maximizing heat dissipation from the -GaO layer.
References in corpus (4)
- Anisotropic Thermal Conductivity in Single Crystal beta-Gallium Oxide
- Thermodynamic Studies of \b{eta}-Ga2O3 Nanomembrane Field-Effect Transistors on a Sapphire Substrate
- Large-Size Free-Standing Single-crystal b-Ga2O3 Membranes Fabricated by Hydrogen Implantation and Lift-Off
- Temperature Dependent Current Dispersion Study in -GaO FETs Using Sub-Microsecond Pulsed IV Characteristics