Partial randomized benchmarking
arXiv:2111.04192 · doi:10.1038/s41598-022-13813-x
Abstract
In randomized benchmarking of quantum logical gates, partial twirling can be used for simpler implementation, better scaling, and higher accuracy and reliability. For instance, for two-qubit gates, single-qubit twirling is easier to realize than full averaging. We analyze such simplified, partial twirling and demonstrate that, unlike for the standard randomized benchmarking, the measured decay of fidelity is a linear combination of exponentials with different decay rates (3 for two qubits and single-bit twirling). The evolution with the sequence length is governed by an iteration matrix, whose spectrum gives the decay rates. For generic two-qubit gates one slowest exponential dominates and characterizes gate errors in three channels. Its decay rate is close, but different from that in the standard randomized benchmarking, and we find the leading correction. Using relations to the local invariants of two-qubit gates we identify all exceptional gates with several slow exponentials and analyze possibilities to extract their decay rates from the measured curves.
References in corpus (40)
- Supplementary information for "Quantum supremacy using a programmable superconducting processor"
- Quantum Error Correction for Quantum Memories
- Quantum state tomography via compressed sensing
- Randomized Benchmarking of Quantum Gates
- Prescription for experimental determination of the dynamics of a quantum black box
- Robust randomized benchmarking of quantum processes
- Complete Characterization of a Quantum Process: the Two-Bit Quantum Gate
- Exact and Approximate Unitary 2-Designs: Constructions and Applications
- Qubit architecture with high coherence and fast tunable coupling
- Computing with spin qubits at the surface code error threshold
- Scalable Noise Estimation with Random Unitary Operators
- Characterizing Quantum Gates via Randomized Benchmarking
- Quantum Process Tomography: Resource Analysis of Different Strategies
- Efficient measurement of quantum gate error by interleaved randomized benchmarking
- A geometric theory of non-local two-qubit operations
- Quantum Tomography via Compressed Sensing: Error Bounds, Sample Complexity, and Efficient Estimators
- Quantum Data Hiding
- Nonlocal properties of two-qubit gates and mixed states and optimization of quantum computations
- Two-qubit silicon quantum processor with operation fidelity exceeding 99%
- Characterization of addressability by simultaneous randomized benchmarking
- Complete methods set for scalable ion trap quantum information processing
- Symmetrised Characterisation of Noisy Quantum Processes
- Characterizing large-scale quantum computers via cycle benchmarking
- Process verification of two-qubit quantum gates by randomized benchmarking
- Gate Set Tomography
- Process tomography of ion trap quantum gates
- Multiqubit Clifford groups are unitary 3-designs
- Randomized Benchmarking with Confidence
- Three Qubit Randomized Benchmarking
- Realisation of a programmable two-qubit quantum processor
- Investigating the limits of randomized benchmarking protocols
- Randomized Benchmarking of Multi-Qubit Gates
- Direct randomized benchmarking for multi-qubit devices
- Entangling flux qubits with a bipolar dynamic inductance
- Gatemon Benchmarking and Two-Qubit Operation
- Experimental Characterization of Crosstalk Errors with Simultaneous Gate Set Tomography
- Randomized Benchmarking with Restricted Gate Sets
- Randomized benchmarking for individual quantum gates
- Metric Structure of the Space of Two-Qubit Gates, Perfect Entanglers and Quantum Control
- Improving the gate fidelity of capacitively coupled spin qubits