Partial randomized benchmarking
arXiv:2111.04192 · doi:10.1038/s41598-022-13813-x
Abstract
In randomized benchmarking of quantum logical gates, partial twirling can be used for simpler implementation, better scaling, and higher accuracy and reliability. For instance, for two-qubit gates, single-qubit twirling is easier to realize than full averaging. We analyze such simplified, partial twirling and demonstrate that, unlike for the standard randomized benchmarking, the measured decay of fidelity is a linear combination of exponentials with different decay rates (3 for two qubits and single-bit twirling). The evolution with the sequence length is governed by an iteration matrix, whose spectrum gives the decay rates. For generic two-qubit gates one slowest exponential dominates and characterizes gate errors in three channels. Its decay rate is close, but different from that in the standard randomized benchmarking, and we find the leading correction. Using relations to the local invariants of two-qubit gates we identify all exceptional gates with several slow exponentials and analyze possibilities to extract their decay rates from the measured curves.
References in corpus (12)
- Supplementary information for "Quantum supremacy using a programmable superconducting processor"
- Randomized Benchmarking of Quantum Gates
- Robust randomized benchmarking of quantum processes
- Quantum Process Tomography: Resource Analysis of Different Strategies
- Quantum Tomography via Compressed Sensing: Error Bounds, Sample Complexity, and Efficient Estimators
- Two-qubit silicon quantum processor with operation fidelity exceeding 99%
- Characterization of addressability by simultaneous randomized benchmarking
- Complete methods set for scalable ion trap quantum information processing
- Symmetrised Characterisation of Noisy Quantum Processes
- Process verification of two-qubit quantum gates by randomized benchmarking
- Process tomography of ion trap quantum gates
- Randomized Benchmarking of Multi-Qubit Gates