Growth, characterization and Chern insulator state in MnBiTe via the chemical vapor transport method
arXiv:2110.05647 · doi:10.1103/PhysRevMaterials.5.124206
Abstract
As the first intrinsic antiferromagnetic topological insulator, MnBiTe has provided a platform to investigate the interplay of band topology and magnetism as well as the emergent phenomena arising from such an interplay. Here we report the chemical-vapor-transport (CVT) growth and characterization of MnBiTe, as well as the observation of the field-induced quantized Hall conductance in 6-layer devices. Through comparative studies between our CVT-grown and flux-grown MnBiTe via magnetic, transport, scanning tunneling microscopy, and angle-resolved photoemission spectroscopy measurements, we find that CVT-grown MnBiTe is marked with higher Mn occupancy on the Mn site, slightly higher Mn antisites, smaller carrier concentration and a Fermi level closer to the Dirac point. Furthermore, a 6-layer device made from the CVT-grown sample shows by far the highest mobility of 2500 cmVs in MnBiTe devices with the quantized Hall conductance appearing at 1.8 K and 8 T. Our study provides a new route to obtain high-quality single crystals of MnBiTe that are promising to make superior devices and realize emergent phenomena, such as the layer Hall effect and quantized anomalous hall effect, etc.
arXiv comment5 figures
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