Radiation-hardened and Repairable MoS Field Effect Devices with Polymer Solid Electrolyte Gates
arXiv:2110.02601 · doi:10.1002/aelm.202100619
Abstract
As human activities expand into naturally or man-made radiation-prone environment, the need for radiation-hardened (Rad-Hard) electronic hardware surged. The state-of-the-art silicon-based and two-dimensional (2D) materials based Rad-Hard transistors can withstand up to 1 Mrad (Si) of total ionization dose (TID), while higher TID tolerance is being heatedly sought after. Here we present few-layer MoS Rad-Hard field-effect transistors (FETs) with polymer solid electrolyte (PSE) gate dielectrics. The MoS PSE-FETs exhibit a TID tolerance of up to 3.75 Mrad (Si) at a dose rate of 523 rad (Si) s and can be repaired with a moderate thermal annealing at 100 C for 5 minutes. Combining the excellent intrinsic radiation tolerance and the reparability, the MoS PSE-FETs reach a TID tolerance of up to 10 Mrad (Si). Complementary metal-oxide-semiconductor (CMOS)-like MoS PSE-inverters have been built and show similar high radiation tolerance. Furthermore, the feasibility of wafer-scale Rad-Hard PSE-inverter array has been demonstrated using chemical vapor deposition (CVD) grown monolayer MoS. Our studies uncover the potential of 2D materials based PSE devices in future Rad-Hard integrated circuits (ICs).
20 pages, 12 figures